Rolf-Peter Vollertsen: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

The TDDB power-law model—Physics and experimental evidences

Rolf-Peter Vollertsen, Enrique Miranda

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 58 KB

english, 2005

2

A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride–oxide dielectrics

Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 150 KB

english, 2002

3

An introduction to fast wafer level reliability monitoring for integrated circuit mass production

Andreas Martin, Rolf-Peter Vollertsen

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 1.10 MB

english, 2004

4

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Dielectric Characterization and Reliability Methodology

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 4.22 MB

english, 2009

5

Is the power-law model applicable beyond the direct tunneling regime?

Rainer Duschl, Rolf-Peter Vollertsen

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 195 KB

english, 2005

6

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Comprehensive physics-based breakdown model for reliability assessment of oxides with thickness ranging from 1 nm up to 12 nm

Wu, Ernest Y., Sune, Jordi, Vollertsen, Rolf-Peter

Year:

2009

Language:

english

File:

PDF, 351 KB

english, 2009

7

Fast wafer level reliability: methods and experiences

Rolf-Peter Vollertsen

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 209 KB

english, 2004

8

Reliability Wearout Mechanisms in Advanced CMOS Technologies ||

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

File:

PDF, 21.10 MB

2009

9

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A novel multi-point NBTI characterization methodology using Smart Intermediate Stress (SIS)

Schlunder, Christian, Hoffmann, Marcel, Vollertsen, Rolf-Peter, Schindler, Gunther, Heinrigs, Wolfgang, Gustin, Wolfgang, Reisinger, Hans

Year:

2008

Language:

english

File:

PDF, 400 KB

english, 2008

10

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Dielectric Breakdown of Gate Oxides: Physics and Experiments

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 3.03 MB

english, 2009

11

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Negative Bias Temperature Instabilities in pMOSFET Devices

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 3.06 MB

english, 2009

12

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Hot Carriers

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 3.21 MB

english, 2009

13

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Stress-Induced Voiding

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 4.26 MB

english, 2009

14

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Electromigration

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 2.56 MB

english, 2009

15

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Introduction

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 1.25 MB

english, 2009

16

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Frontmatter

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 222 KB

english, 2009

17

Reliability Wearout Mechanisms in Advanced CMOS Technologies || Index

Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Su, Jordi, La Rosa, Giuseppe, Rauch, Stewart E., Sullivan, Timothy D.

Year:

2009

Language:

english

File:

PDF, 117 KB

english, 2009

18

[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - MOS transistor characteristics and its dependence of plasma charging degradation on the test structure layout for a 0.13µm CMOS technology

Martin, Andreas, Vollertsen, Rolf-Peter, Reisinger, Hans

Year:

2010

Language:

english

File:

PDF, 420 KB

english, 2010

19

[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - A new smart Vth-extraction methodology considering recovery and mobility degradation due to NBTI

Schlunder, Christian, Hoffmann, Marcel, Vollertsen, Rolf-Peter, Schindler, Gunther, Heinrigs, Wolfgang, Gustin, Wolfgang, Reisinger, Hans

Year:

2007

Language:

english

File:

PDF, 229 KB

english, 2007

20

[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - A reliable and accurate approach to assess NBTI behavior of state-of-the-art pMOSFETs with fast-WLR

Schluender, Christian, Vollertsen, Rolf-Peter, Gustin, Wolfgang, Reisinger, Hans

Year:

2007

Language:

english

File:

PDF, 249 KB

english, 2007

21

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Physical understanding and modelling of new hot-carrier degradation effect on PLDMOS transistor

Aresu, Stefano, Vollertsen, Rolf-Peter, Rudolf, Ralf, Schlunder, Christian, Reisinger, Hans, Gustin, Wolfgang

Year:

2012

Language:

english

File:

PDF, 2.35 MB

english, 2012

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски